High-voltage door handle capacitors: Safeguarding nondestructive testing equipment
| No. |
Specification |
Dissipation |
Withstanding Voltage |
Insulation Resistance |
Dimensions (mm) |
| 1 |
20kV-2000pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:45 | H:19 | L:23 | D:12 | M:5 |
| 2 |
20kV-10000pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:65 | H:15 | L:19 | D:12 | M:5 |
| 3 |
20kV-18000pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:80 | H:17 | L:25 | D:12 | M:5 |
| 4 |
30kV-1000pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:45 | H:24 | L:32 | D:12 | M:4 |
| 5 |
30kV-2700pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:60 | H:20 | L:28 | D:12 | M:4 |
| 6 |
30kV-12000pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:45 | H:19 | L:23 | D:12 | M:5 |
| 7 |
40kV-150pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:74 | H:18 | L:26 | D:12 | M:5 |
| 8 |
40kV-500pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:28 | H:33 | L:41 | D:8 | M:4 |
| 9 |
40kV-7500pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:80 | H:24 | L:29 | D:12 | M:6 |
| 10 |
40kV-10000pF |
≤0.0040 |
1.5Ur● 1min |
≥1.0 x 105MΩ |
D:80 | H:22 | L:26 | D:16 | M:5 |
Tens of thousands of exposures, consistent performance: The long-term reliability of high-voltage door handle capacitors safeguards non-destructive testing equipment. Non-destructive testing equipment, especially on automated production lines, undergoes thousands of repetitive tests day after day. Each test involves the high-voltage power supply being activated, exposed, and shut down. This high-frequency charge and discharge cycle places a severe strain on the durability of capacitors. Capacitor performance degradation directly leads to equipment degradation and even unplanned downtime.
Durability: The key to maintenance-free operation of non-destructive testing equipment.
The primary concerns of equipment manufacturers and end users are:
Can it withstand millions of charge and discharge cycles?
Will the capacitance value significantly degrade over time?
Will its lifespan be drastically shortened in high-temperature environments?
Our Longevity Gene: The Result of Materials Science and Processing
Our high-voltage door handle capacitors are designed with long-term reliability as a core goal from the outset:
Aging-resistant ceramic dielectric: Utilizing an optimized barium strontium titanate-based ceramic material, a doping process effectively suppresses dielectric aging, ensuring highly stable capacitance over decades.
Strengthened Electrode Interface: The advanced co-firing process of the metallized electrodes and ceramic dielectric creates a strong interface bond, effectively resisting fatigue damage caused by thermal expansion and contraction, as well as electrical stress.
Excellent Thermal Management: Low dissipation (DF) means lower self-heating. Combined with the heat dissipation advantages of the metal casing, this keeps the core temperature low. A rule of thumb: For every 10°C reduction in operating temperature, the lifespan doubles.
Promise and Verification:
Based on accelerated life testing data, we guarantee that our capacitors can withstand over one million full-load charge and discharge cycles at rated voltage and maximum operating temperature with a capacity degradation rate of less than 5%. This ensures that your device's testing performance will not be compromised by degradation of the core capacitor throughout its lifecycle.
Choosing us means choosing a solid commitment to long-term, stable operation, ensuring your equipment remains as good as new in harsh industrial environments.
Product Tags:
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High Voltage Ceramic Doorknob Capacitors 20kV-2000pF 20kV-10000pF 20kV-18000pF for Non-destructive Testing Equipment Images
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